OIL & GAS, SHALE SEM MAPS IMAGING:

High resolution BSE (back scatter) SEM MAPS imaging and EDS elemental analysis over large areas to observe the pore systems and clay characteristics at the nanometer scale in unconventional reservoir samples. The MAPS image database is compatible with Microsoft's HD View allowing for efficient observation of the high resolution mosaic. Come check out our rock services here.

IC DESIGN VERIFICATION:

Verify design changes before and after you spin a new mask. Make modifications in a fraction of the time it takes to get new material out of the FAB.

DEBUG:

Need to probe a burried net or a metal line smaller than your probe tip? FIB-X can enable your debug requirements by installing FIB probe pads.

CROSS SECTIONS:

Looking for voids in your VIA or process defects? Our 5nm ion column will give you clean and precise cross sections allowing you to verify process anomalies. We also have a fast Bruker Quantax 200 EDS for elemental analysis of contaminants.

DECAPSULATION & ENCAPSULATION:

Don't worry if your devices are packaged. We have the equipment and experience to decapsulate your device, exposing it for FIB modifications and or debug. We also offer encapsulation for safer handling by your customers or for clam-shell sockets that apply pressure to the top of the device. In some cases, you might want a temporary lid fixed to the top of your device which we can also provide.

X-SERVICES:

The X in our name should remind you that we are more than your standard, run of the mill FIB house. If you think it can be done on a FIB contact us to see what we think with regards to feasibility, time, and cost. We're not afraid to attempt new applications and have plenty of success stories. We'll give our best effort to make a new idea work.